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C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing
ISK 4758567
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With one-click testing for various semiconductor power devices and integrated support for significant measurement characteristics, the TH511 is an essential tool for efficient production line testing.
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Upplýsingar um vöru
| Power Source | Ac |
| Lower Temperature Rating | 32 u00b0C |
| Minimum Operating Voltage | 100 volts |
| Upper Temperature Rating | 140 u00b0C |
| Measurement Type | Voltage |
| Maximum Operating Voltage | 1000 volts |
| Style Name | Digital |
| Color | Black |
| Item Weight | 33 pounds (14.97 kg) |
| Item Dimensions | 6.97 x 15.94 x 16.93 inches (17.7 x 40.5 x 43 cm) |
| Brand Name | YITRANIC |
| Model | Cv2000 |
| Number of Items | 1 |
| Manufacturer | YITRANIC |
| Included Components | C-V Analyzer, PIV testing fixture, Cable |
| Part Number | Cv2000 |
| Specification Met | Iec 61010 |
| Brand | YITRANIC |
| Style | Digital |
Who Should Buy?
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Semiconductor Researchers
Ideal for researchers analyzing semiconductor properties and developing advanced materials for electronic applications.
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Quality Control Engineers
Perfect for engineers in quality control to ensure semiconductor devices meet performance specifications and standards.
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Electronics Educators
Excellent tool for educators in electronics programs to teach students about semiconductor behavior and testing methods.
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Casual Hobbyists
Not suitable for casual users or hobbyists without advanced knowledge of semiconductor testing and interpretation.
VÖRULÝSING
C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing
Spurningar og svör viðskiptavina
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spurningu:
What types of devices can the TH511 analyze?
svara: It can analyze diodes, transistors, MOSFETs, and IGBTs. -
spurningu:
What is the testing frequency range of the TH511?
svara: The testing frequency range is 1kHz to 2MHz. -
spurningu:
Can the TH511 support parallel testing?
svara: Yes, the TH511 supports parallel testing of up to 6 discrete devices or modules simultaneously.
YITRANIC LCR Meters Editorial Review
Customer Reviews & Ratings
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Product Price History
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ISK 4758567
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Eiginleikar og kostir
- Integrated design allows for one-click testing of parasitic capacitance and C-V characteristics.
- Capable of testing diodes, transistors, MOSFETs, and IGBTs without frequent cable adjustments.
- Supports rapid testing and automated integration, ideal for production lines.
- C-V curve scanning meets R&D and characterization needs in laboratory settings.
- Features a large 10.1-inch display for instant analysis and simultaneous data viewing.
- Parallel testing of up to 6 devices streamlines testing processes.
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